Aims and Objectives
The aim of SAIF-AIIMS is to strive for excellence and ensure maximal utilization of the national resource to foster the research related to electron microscopy.
The facility is committed to
- Contribute to achieve the research excellence in the area of electron microscopy imaging for national researchers
- Provide expertise for the use of equipment, interpretation and evaluation of ultrastructural data,
- Develop new techniques in ultrastructural research to facilitate scientists working in the front-line areas of research and
- Organize regular training programs, workshops and symposia on Electron Microscopy for manpower development.